TEST_NAME : Wafer
TEST_DATE : 24_08_23-15_00_12
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-012-012-025-13 | FUSED_ID : 6359364768385515933
  IC_TEMP :  -58.88 | VDDM : 1109.68 | AUX_INT :   -7.38 | CsaBias :   60.18
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.08507e-03 / 2
  ADC_P0  : -7.37710e-03 ± 2.23037e-02
  ADC_P1  : 8.49322e-03 ± 5.56381e-04
  ADC_P2  : -6.08294e-06 ± 2.74046e-06
  CSA_Chi2/NDF : 1.85905e-04 / 2
  CSA_P0  : 5.78040e-02 ± 9.09427e-03
  CSA_P1  : 1.02862e-02 ± 6.85188e-04
  CSA_P2  : -5.33471e-05 ± 1.04346e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [13, 17, 48, 62, 80, 84, 101]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [29, 48, 63, 67, 75, 104, 107, 121, 122, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3099', '1.800', '0.1405', '1.800', '0.0945', '7.000', '0.7079', 1, 1, 1, 1, 1724418012.4870298]
VI_after__Init : ['1.201', '0.3099', '1.800', '0.1405', '1.800', '0.0874', '7.000', '0.7071', 1, 1, 1, 1, 1724418020.508432]
VI_at__the_End : ['1.201', '0.4899', '1.800', '0.1377', '1.800', '0.1143', '7.000', '0.7080', 1, 1, 1, 1, 1724418081.8515773]