TEST_NAME : Wafer
TEST_DATE : 24_08_23-15_01_49
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-012-012-026-13 | FUSED_ID : 6359364768385515949
  IC_TEMP :  -56.91 | VDDM : 1114.59 | AUX_INT :   -7.97 | CsaBias :   78.05
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.08536e-03 / 2
  ADC_P0  : -7.97482e-03 ± 2.23113e-02
  ADC_P1  : 8.66270e-03 ± 5.69117e-04
  ADC_P2  : -6.02182e-06 ± 2.88107e-06
  CSA_Chi2/NDF : 1.67714e-04 / 2
  CSA_P0  : 6.17776e-02 ± 8.63787e-03
  CSA_P1  : 1.02154e-02 ± 6.50801e-04
  CSA_P2  : -4.99842e-05 ± 9.91093e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [25, 54, 61, 64, 68, 69, 75, 80, 85, 87, 104, 109, 124, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  15
 | P_BROKEN_FAST :  [11, 15, 16, 21, 25, 38, 47, 73, 75, 79, 102, 103, 108, 117, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3613', '1.800', '0.1722', '1.800', '0.0900', '7.000', '0.7072', 1, 1, 1, 1, 1724418108.8664994]
VI_after__Init : ['1.202', '0.3616', '1.800', '0.1721', '1.800', '0.0846', '7.000', '0.7071', 1, 1, 1, 1, 1724418116.9588966]
VI_at__the_End : ['1.202', '0.5024', '1.800', '0.1398', '1.800', '0.1118', '7.000', '0.7079', 1, 1, 1, 1, 1724418182.0918508]