TEST_NAME : Wafer
TEST_DATE : 24_08_23-15_05_00
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-012-013-026-00 | FUSED_ID : 6359364768385520032
  IC_TEMP :  -54.97 | VDDM : 1125.07 | AUX_INT :   -6.97 | CsaBias :   67.26
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.02998e-03 / 2
  ADC_P0  : -6.96607e-03 ± 2.17392e-02
  ADC_P1  : 8.29720e-03 ± 5.34029e-04
  ADC_P2  : -5.58962e-06 ± 2.58965e-06
  CSA_Chi2/NDF : 9.83641e-05 / 2
  CSA_P0  : 6.03076e-02 ± 6.61516e-03
  CSA_P1  : 9.67959e-03 ± 4.98405e-04
  CSA_P2  : -4.37168e-05 ± 7.59012e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [0, 3, 12, 14, 39, 59, 109, 111, 115, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  16
 | P_BROKEN_FAST :  [9, 14, 23, 37, 38, 42, 59, 61, 62, 90, 92, 94, 96, 112, 117, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3750', '1.800', '0.1107', '1.800', '0.0931', '7.000', '0.7071', 1, 1, 1, 1, 1724418300.3226404]
VI_after__Init : ['1.202', '0.3752', '1.800', '0.1107', '1.799', '0.0873', '7.000', '0.7069', 1, 1, 1, 1, 1724418308.449981]
VI_at__the_End : ['1.201', '0.4910', '1.800', '0.1319', '1.803', '0.1090', '7.000', '0.7079', 1, 1, 1, 1, 1724418374.881841]