TEST_NAME : Wafer
TEST_DATE : 24_08_26-16_06_04
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-003-007-06 | FUSED_ID : 6359364768386527350
  IC_TEMP :  -74.06 | VDDM : 1113.21 | AUX_INT :  -11.63 | CsaBias :   49.53
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.08261e-03 / 2
  ADC_P0  : -1.16331e-02 ± 3.09624e-02
  ADC_P1  : 8.78228e-03 ± 7.82195e-04
  ADC_P2  : -6.40752e-06 ± 3.96032e-06
  CSA_Chi2/NDF : 1.87174e-04 / 2
  CSA_P0  : 5.66012e-02 ± 9.12525e-03
  CSA_P1  : 1.02591e-02 ± 6.87522e-04
  CSA_P2  : -6.18305e-05 ± 1.04701e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [11, 25, 43, 44, 55, 59, 65, 82, 86, 100, 106, 107, 121, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [18, 19, 30, 32, 54, 56, 57, 59, 61, 64, 77, 85, 103, 104]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3155', '1.800', '0.1138', '1.799', '0.1016', '7.000', '0.7077', 1, 1, 1, 1, 1724681164.2863417]
VI_after__Init : ['1.201', '0.3162', '1.800', '0.1140', '1.802', '0.0954', '7.000', '0.7076', 1, 1, 1, 1, 1724681172.4716556]
VI_at__the_End : ['1.201', '0.4528', '1.800', '0.1353', '1.801', '0.1209', '7.000', '0.7085', 1, 1, 1, 1, 1724681240.5084224]