TEST_NAME : Wafer
TEST_DATE : 24_08_26-16_02_53
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-003-009-06 | FUSED_ID : 6359364768386527382
  IC_TEMP :  -78.33 | VDDM : 1119.52 | AUX_INT :  -11.53 | CsaBias :   50.77
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.09040e-03 / 2
  ADC_P0  : -1.15329e-02 ± 3.10322e-02
  ADC_P1  : 8.94685e-03 ± 8.00978e-04
  ADC_P2  : -6.56151e-06 ± 4.14253e-06
  CSA_Chi2/NDF : 1.82720e-04 / 2
  CSA_P0  : 5.63759e-02 ± 9.01603e-03
  CSA_P1  : 1.05387e-02 ± 6.79293e-04
  CSA_P2  : -6.87577e-05 ± 1.03448e-05
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [6, 13, 34, 47, 53, 59, 65, 67, 78, 86, 90, 102, 113]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [1, 32, 38, 42, 57, 70, 74, 77, 78, 100, 109, 120, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.2646', '1.800', '0.1587', '1.799', '0.0970', '7.000', '0.7074', 1, 1, 1, 1, 1724680973.1141868]
VI_after__Init : ['1.201', '0.2649', '1.800', '0.1589', '1.800', '0.0914', '7.000', '0.7077', 1, 1, 1, 1, 1724680981.167599]
VI_at__the_End : ['1.202', '0.4453', '1.800', '0.1348', '1.800', '0.1226', '7.000', '0.7085', 1, 1, 1, 1, 1724681041.2428255]