TEST_NAME : Wafer
TEST_DATE : 24_08_26-16_01_17
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-003-010-06 | FUSED_ID : 6359364768386527398
  IC_TEMP :  -71.05 | VDDM : 1113.43 | AUX_INT :  -13.26 | CsaBias :   46.65
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.93249e-03 / 2
  ADC_P0  : -1.32619e-02 ± 3.68597e-02
  ADC_P1  : 8.59814e-03 ± 9.15470e-04
  ADC_P2  : -5.70949e-06 ± 4.58093e-06
  CSA_Chi2/NDF : 2.11494e-04 / 2
  CSA_P0  : 5.61362e-02 ± 9.70000e-03
  CSA_P1  : 1.03579e-02 ± 7.30825e-04
  CSA_P2  : -6.59856e-05 ± 1.11296e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [40, 47, 54, 55, 57, 73, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [6, 15, 17, 27, 31, 35, 37, 81, 83, 98, 103, 109, 115]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3213', '1.800', '0.1464', '1.799', '0.1051', '7.000', '0.7075', 1, 1, 1, 1, 1724680877.453577]
VI_after__Init : ['1.201', '0.3219', '1.800', '0.1471', '1.800', '0.0989', '7.000', '0.7074', 1, 1, 1, 1, 1724680885.5178938]
VI_at__the_End : ['1.201', '0.4435', '1.800', '0.1338', '1.799', '0.1222', '7.000', '0.7085', 1, 1, 1, 1, 1724680952.2657247]