TEST_NAME : Wafer
TEST_DATE : 24_08_26-15_59_42
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-003-011-06 | FUSED_ID : 6359364768386527414
  IC_TEMP :  -79.93 | VDDM : 1122.70 | AUX_INT :  -10.59 | CsaBias :   35.50
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.67170e-03 / 2
  ADC_P0  : -1.05865e-02 ± 2.76648e-02
  ADC_P1  : 9.25746e-03 ± 7.27112e-04
  ADC_P2  : -7.94454e-06 ± 3.80294e-06
  CSA_Chi2/NDF : 1.76336e-04 / 2
  CSA_P0  : 5.67966e-02 ± 8.85714e-03
  CSA_P1  : 1.03318e-02 ± 6.67321e-04
  CSA_P2  : -6.71177e-05 ± 1.01625e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  15
 | N_BROKEN_FAST :  [2, 3, 14, 21, 25, 31, 41, 55, 58, 59, 68, 90, 92, 109, 115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  18
 | P_BROKEN_FAST :  [3, 9, 10, 19, 27, 30, 35, 39, 40, 49, 59, 65, 70, 72, 73, 85, 87, 106]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2480', '1.800', '0.1562', '1.799', '0.0937', '7.000', '0.7073', 1, 1, 1, 1, 1724680781.7629786]
VI_after__Init : ['1.201', '0.2483', '1.800', '0.1565', '1.800', '0.0881', '7.000', '0.7072', 1, 1, 1, 1, 1724680789.7543347]
VI_at__the_End : ['1.201', '0.4360', '1.800', '0.1338', '1.801', '0.1226', '7.000', '0.7083', 1, 1, 1, 1, 1724680856.6001897]