TEST_NAME : Wafer
TEST_DATE : 24_08_26-15_58_06
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-003-012-06 | FUSED_ID : 6359364768386527430
  IC_TEMP :  -80.06 | VDDM : 1122.25 | AUX_INT :  -12.16 | CsaBias :   48.30
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.18375e-03 / 2
  ADC_P0  : -1.21649e-02 ± 3.16597e-02
  ADC_P1  : 8.68571e-03 ± 7.76401e-04
  ADC_P2  : -6.89695e-06 ± 3.80978e-06
  CSA_Chi2/NDF : 1.73209e-04 / 2
  CSA_P0  : 5.83301e-02 ± 8.77824e-03
  CSA_P1  : 1.00431e-02 ± 6.61377e-04
  CSA_P2  : -6.27296e-05 ± 1.00720e-05
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [8, 13, 19, 42, 87, 89, 96, 107, 109, 114, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [7, 12, 28, 35, 43, 64, 76, 86, 92, 95, 100, 102, 105]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.3937', '1.800', '0.1133', '1.799', '0.0976', '7.000', '0.7074', 1, 1, 1, 1, 1724680685.7963605]
VI_after__Init : ['1.201', '0.3952', '1.800', '0.1142', '1.800', '0.0921', '7.000', '0.7073', 1, 1, 1, 1, 1724680693.9567316]
VI_at__the_End : ['1.201', '0.4386', '1.800', '0.1335', '1.807', '0.1225', '7.000', '0.7080', 1, 1, 1, 1, 1724680760.8024879]