TEST_NAME : Wafer
TEST_DATE : 24_08_26-15_54_54
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-003-014-06 | FUSED_ID : 6359364768386527462
  IC_TEMP :  -80.81 | VDDM : 1121.77 | AUX_INT :   -9.23 | CsaBias :   44.04
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.26971e-03 / 2
  ADC_P0  : -9.23179e-03 ± 2.41100e-02
  ADC_P1  : 8.91828e-03 ± 6.23376e-04
  ADC_P2  : -6.71462e-06 ± 3.21036e-06
  CSA_Chi2/NDF : 1.20313e-04 / 2
  CSA_P0  : 5.84957e-02 ± 7.31608e-03
  CSA_P1  : 1.05297e-02 ± 5.51214e-04
  CSA_P2  : -7.01049e-05 ± 8.39434e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [2, 37, 49, 66, 70, 72, 86, 98, 100, 108, 113, 118, 125, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  19
 | P_BROKEN_FAST :  [7, 8, 16, 19, 30, 32, 56, 58, 66, 67, 75, 85, 95, 102, 104, 117, 121, 123, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1464', '1.800', '0.1748', '1.799', '0.0878', '7.000', '0.7074', 1, 1, 1, 1, 1724680493.9779894]
VI_after__Init : ['1.202', '0.1465', '1.800', '0.1749', '1.801', '0.0822', '7.000', '0.7074', 1, 1, 1, 1, 1724680502.3013268]
VI_at__the_End : ['1.201', '0.4419', '1.800', '0.1349', '1.805', '0.1221', '7.000', '0.7082', 1, 1, 1, 1, 1724680562.2827172]