TEST_NAME : Wafer
TEST_DATE : 24_08_26-15_48_30
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-003-018-01 | FUSED_ID : 6359364768386527521
  IC_TEMP :  -90.28 | VDDM : 1115.33 | AUX_INT :  -10.38 | CsaBias :   52.58
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.75061e-03 / 2
  ADC_P0  : -1.03835e-02 ± 2.83778e-02
  ADC_P1  : 9.04174e-03 ± 7.43382e-04
  ADC_P2  : -6.78472e-06 ± 3.88588e-06
  CSA_Chi2/NDF : 6.67718e-04 / 2
  CSA_P0  : 5.26206e-02 ± 1.72353e-02
  CSA_P1  : 1.01777e-02 ± 1.29856e-03
  CSA_P2  : -6.64176e-05 ± 1.97755e-05
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  15
 | N_BROKEN_FAST :  [9, 13, 36, 40, 44, 53, 64, 67, 88, 90, 97, 102, 109, 122, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [39, 41, 46, 52, 53, 57, 67, 74, 89, 110]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.2463', '1.800', '0.1345', '1.800', '0.1044', '7.001', '0.7083', 1, 1, 1, 1, 1724680109.8766408]
VI_after__Init : ['1.202', '0.2467', '1.800', '0.1354', '1.801', '0.0967', '6.996', '0.7079', 1, 1, 1, 1, 1724680118.0829182]
VI_at__the_End : ['1.201', '0.4213', '1.800', '0.1290', '1.801', '0.1268', '7.000', '0.7082', 1, 1, 1, 1, 1724680186.678668]