TEST_NAME : Wafer
TEST_DATE : 24_08_26-15_45_17
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-003-020-01 | FUSED_ID : 6359364768386527553
  IC_TEMP :  -95.30 | VDDM : 1126.12 | AUX_INT :  -11.36 | CsaBias :   44.39
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.93780e-03 / 2
  ADC_P0  : -1.13598e-02 ± 2.98198e-02
  ADC_P1  : 9.33997e-03 ± 7.89354e-04
  ADC_P2  : -7.95175e-06 ± 4.17412e-06
  CSA_Chi2/NDF : 1.19623e-04 / 2
  CSA_P0  : 5.80503e-02 ± 7.29509e-03
  CSA_P1  : 1.04616e-02 ± 5.49632e-04
  CSA_P2  : -7.46261e-05 ± 8.37025e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [10, 14, 32, 40, 47, 57, 74, 82, 93, 96, 99, 101, 115, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [12, 38, 59, 75, 82, 94, 101, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1134', '1.800', '0.1669', '1.799', '0.0926', '7.000', '0.7076', 1, 1, 1, 1, 1724679917.484547]
VI_after__Init : ['1.201', '0.1134', '1.800', '0.1670', '1.801', '0.0865', '7.000', '0.7076', 1, 1, 1, 1, 1724679926.0448723]
VI_at__the_End : ['1.201', '0.4149', '1.800', '0.1311', '1.800', '0.1283', '7.000', '0.7083', 1, 1, 1, 1, 1724679994.917543]