TEST_NAME : Wafer
TEST_DATE : 24_08_26-15_43_41
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-003-021-01 | FUSED_ID : 6359364768386527569
  IC_TEMP :  -92.20 | VDDM : 1118.83 | AUX_INT :  -11.65 | CsaBias :   35.88
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.90074e-03 / 2
  ADC_P0  : -1.16468e-02 ± 2.94605e-02
  ADC_P1  : 9.55015e-03 ± 7.82467e-04
  ADC_P2  : -9.10180e-06 ± 4.13977e-06
  CSA_Chi2/NDF : 1.16469e-04 / 2
  CSA_P0  : 5.90605e-02 ± 7.19825e-03
  CSA_P1  : 1.05730e-02 ± 5.42336e-04
  CSA_P2  : -7.43565e-05 ± 8.25914e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  15
 | N_BROKEN_FAST :  [0, 17, 18, 22, 31, 40, 48, 55, 62, 76, 79, 99, 100, 124, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [1, 6, 15, 19, 30, 33, 38, 52, 74, 96, 104, 105]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3655', '1.800', '0.1373', '1.799', '0.1073', '7.000', '0.7077', 1, 1, 1, 1, 1724679821.409042]
VI_after__Init : ['1.201', '0.3662', '1.800', '0.1378', '1.800', '0.1011', '7.000', '0.7077', 1, 1, 1, 1, 1724679829.6053493]
VI_at__the_End : ['1.202', '0.4240', '1.800', '0.1334', '1.808', '0.1271', '6.991', '0.7083', 1, 1, 1, 1, 1724679899.6529703]