TEST_NAME : Wafer
TEST_DATE : 24_08_26-16_10_52
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-004-008-14 | FUSED_ID : 6359364768386531470
  IC_TEMP :  -73.80 | VDDM : 1114.52 | AUX_INT :   -9.82 | CsaBias :   49.31
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.45204e-03 / 2
  ADC_P0  : -9.81760e-03 ± 2.57887e-02
  ADC_P1  : 8.49089e-03 ± 6.29506e-04
  ADC_P2  : -6.34243e-06 ± 3.05808e-06
  CSA_Chi2/NDF : 1.59647e-04 / 2
  CSA_P0  : 5.86077e-02 ± 8.42757e-03
  CSA_P1  : 9.96555e-03 ± 6.34957e-04
  CSA_P2  : -5.94811e-05 ± 9.66964e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [20, 29, 34, 56, 76, 87, 92, 95, 102, 105, 115, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [1, 9, 48, 52, 65, 81, 100, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4038', '1.800', '0.1563', '1.800', '0.1090', '7.000', '0.7073', 1, 1, 1, 1, 1724681451.9870994]
VI_after__Init : ['1.202', '0.4059', '1.800', '0.1567', '1.801', '0.1030', '7.000', '0.7075', 1, 1, 1, 1, 1724681460.1835058]
VI_at__the_End : ['1.202', '0.4458', '1.800', '0.1331', '1.803', '0.1212', '7.000', '0.7085', 1, 1, 1, 1, 1724681527.5202403]