TEST_NAME : Wafer
TEST_DATE : 24_08_26-16_12_27
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-004-009-14 | FUSED_ID : 6359364768386531486
  IC_TEMP :  -73.01 | VDDM : 1108.95 | AUX_INT :   -9.48 | CsaBias :   51.52
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.30420e-03 / 2
  ADC_P0  : -9.47694e-03 ± 2.44271e-02
  ADC_P1  : 8.75983e-03 ± 6.18131e-04
  ADC_P2  : -6.56410e-06 ± 3.11672e-06
  CSA_Chi2/NDF : 1.99362e-04 / 2
  CSA_P0  : 5.86242e-02 ± 9.41767e-03
  CSA_P1  : 1.04682e-02 ± 7.09553e-04
  CSA_P2  : -6.63792e-05 ± 1.08057e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [25, 29, 33, 65, 68, 76, 86]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  19
 | P_BROKEN_FAST :  [0, 9, 10, 23, 31, 32, 33, 43, 50, 55, 56, 60, 67, 85, 87, 95, 116, 120]
 | P_BROKEN_SLOW :  [15]
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4271', '1.800', '0.1309', '1.799', '0.1010', '7.000', '0.7076', 1, 1, 1, 1, 1724681547.6156073]
VI_after__Init : ['1.202', '0.4288', '1.800', '0.1315', '1.799', '0.0954', '7.000', '0.7075', 1, 1, 1, 1, 1724681555.6351388]
VI_at__the_End : ['1.202', '0.4508', '1.800', '0.1346', '1.802', '0.1219', '7.000', '0.7082', 1, 1, 1, 1, 1724681621.7640212]