TEST_NAME : Wafer
TEST_DATE : 24_08_26-16_17_16
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-004-012-14 | FUSED_ID : 6359364768386531534
  IC_TEMP :  -65.37 | VDDM : 1117.98 | AUX_INT :  -11.76 | CsaBias :   72.47
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.06896e-03 / 2
  ADC_P0  : -1.17600e-02 ± 3.08286e-02
  ADC_P1  : 8.48682e-03 ± 7.44728e-04
  ADC_P2  : -6.36802e-06 ± 3.59840e-06
  CSA_Chi2/NDF : 1.76699e-04 / 2
  CSA_P0  : 5.64210e-02 ± 8.86623e-03
  CSA_P1  : 9.89530e-03 ± 6.68006e-04
  CSA_P2  : -5.52439e-05 ± 1.01729e-05
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [2, 16, 37, 62, 70, 75, 76, 84, 94, 120, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [3, 16, 20, 28, 36, 41, 59, 67, 83, 104]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.3333', '1.800', '0.1525', '1.799', '0.0944', '7.000', '0.7078', 1, 1, 1, 1, 1724681836.510485]
VI_after__Init : ['1.201', '0.3337', '1.800', '0.1526', '1.799', '0.0886', '7.000', '0.7076', 1, 1, 1, 1, 1724681844.6589286]
VI_at__the_End : ['1.201', '0.4573', '1.800', '0.1348', '1.804', '0.1177', '7.000', '0.7086', 1, 1, 1, 1, 1724681912.0557582]