TEST_NAME : Wafer
TEST_DATE : 24_08_26-16_18_52
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-004-013-14 | FUSED_ID : 6359364768386531550
  IC_TEMP :  -76.17 | VDDM : 1120.29 | AUX_INT : -116.42 | CsaBias :  -53.99
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 3.14854e-03 / 2
  ADC_P0  : -1.16419e-01 ± 4.68793e-02
  ADC_P1  : 1.04728e-02 ± 1.18069e-03
  ADC_P2  : -1.13349e-05 ± 5.91489e-06
  CSA_Chi2/NDF : 1.52545e-04 / 2
  CSA_P0  : 5.85361e-02 ± 8.23798e-03
  CSA_P1  : 1.06467e-02 ± 6.20672e-04
  CSA_P2  : -7.11916e-05 ± 9.45211e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  17
 | N_BROKEN_FAST :  [3, 8, 12, 23, 32, 33, 36, 44, 49, 65, 72, 87, 89, 93, 107, 115, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [11, 12, 14, 48, 53, 79, 81, 95, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3089', '1.800', '0.1371', '1.800', '0.0993', '7.000', '0.7076', 1, 1, 1, 1, 1724681931.5122209]
VI_after__Init : ['1.201', '0.3075', '1.800', '0.1373', '1.800', '0.0932', '7.000', '0.7077', 1, 1, 1, 1, 1724681940.3266253]
VI_at__the_End : ['1.201', '0.4428', '1.800', '0.1330', '1.804', '0.1241', '7.000', '0.7086', 1, 1, 1, 1, 1724682008.2802563]