TEST_NAME : Wafer
TEST_DATE : 24_08_26-16_22_03
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-004-015-14 | FUSED_ID : 6359364768386531582
  IC_TEMP :  -66.72 | VDDM : 1115.78 | AUX_INT :  -10.08 | CsaBias :   57.23
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.71486e-03 / 2
  ADC_P0  : -1.00825e-02 ± 2.81573e-02
  ADC_P1  : 8.45199e-03 ± 7.10669e-04
  ADC_P2  : -4.74090e-06 ± 3.59676e-06
  CSA_Chi2/NDF : 1.83801e-04 / 2
  CSA_P0  : 5.58580e-02 ± 9.04265e-03
  CSA_P1  : 1.02349e-02 ± 6.81299e-04
  CSA_P2  : -6.10671e-05 ± 1.03754e-05
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [0, 13, 32, 37, 40, 41, 72, 88, 94, 100, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [12, 32, 48, 55, 56, 58, 71, 83, 86, 90, 93, 103, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.3391', '1.800', '0.1446', '1.800', '0.0960', '7.000', '0.7082', 1, 1, 1, 1, 1724682123.130586]
VI_after__Init : ['1.202', '0.3397', '1.800', '0.1448', '1.800', '0.0904', '7.000', '0.7083', 1, 1, 1, 1, 1724682131.253886]
VI_at__the_End : ['1.202', '0.4536', '1.800', '0.1340', '1.807', '0.1192', '7.000', '0.7086', 1, 1, 1, 1, 1724682189.287398]