TEST_NAME : Wafer
TEST_DATE : 24_08_26-16_23_39
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-004-016-09 | FUSED_ID : 6359364768386531593
  IC_TEMP :  -68.06 | VDDM : 1116.50 | AUX_INT :   -9.62 | CsaBias :   60.26
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.43965e-03 / 2
  ADC_P0  : -9.62462e-03 ± 2.57044e-02
  ADC_P1  : 8.78654e-03 ± 6.56485e-04
  ADC_P2  : -6.37419e-06 ± 3.34253e-06
  CSA_Chi2/NDF : 1.97713e-04 / 2
  CSA_P0  : 5.98856e-02 ± 9.37865e-03
  CSA_P1  : 1.04074e-02 ± 7.06613e-04
  CSA_P2  : -6.15516e-05 ± 1.07609e-05
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [15, 19, 22, 55, 56, 69, 75, 98, 100]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [12, 45, 56, 68, 75, 81, 82, 89, 109, 114, 117, 118, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.0982', '1.800', '0.1581', '1.799', '0.0845', '7.000', '0.7080', 1, 1, 1, 1, 1724682219.3022442]
VI_after__Init : ['1.202', '0.0982', '1.800', '0.1581', '1.800', '0.0789', '7.000', '0.7079', 1, 1, 1, 1, 1724682227.5155282]
VI_at__the_End : ['1.201', '0.4607', '1.800', '0.1360', '1.811', '0.1190', '7.000', '0.7086', 1, 1, 1, 1, 1724682286.540051]