TEST_NAME : Wafer
TEST_DATE : 24_08_26-16_30_02
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-004-020-09 | FUSED_ID : 6359364768386531657
  IC_TEMP :  -73.40 | VDDM : 1121.71 | AUX_INT :   -7.07 | CsaBias :   45.30
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.81981e-04 / 2
  ADC_P0  : -7.07454e-03 ± 1.88779e-02
  ADC_P1  : 8.76913e-03 ± 4.81387e-04
  ADC_P2  : -6.78885e-06 ± 2.42683e-06
  CSA_Chi2/NDF : 2.17045e-04 / 2
  CSA_P0  : 5.84635e-02 ± 9.82645e-03
  CSA_P1  : 1.01795e-02 ± 7.40352e-04
  CSA_P2  : -6.15199e-05 ± 1.12747e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  17
 | N_BROKEN_FAST :  [7, 18, 19, 35, 63, 65, 76, 79, 82, 87, 88, 106, 107, 111, 115, 125]
 | N_BROKEN_SLOW :  [100]
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [0, 5, 7, 8, 9, 14, 19, 31, 52, 71, 73, 85, 119]
 | P_BROKEN_SLOW :  [100]
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3655', '1.800', '0.1345', '1.800', '0.0947', '7.000', '0.7073', 1, 1, 1, 1, 1724682602.4798052]
VI_after__Init : ['1.201', '0.3661', '1.800', '0.1345', '1.800', '0.0887', '7.000', '0.7074', 1, 1, 1, 1, 1724682610.5181565]
VI_at__the_End : ['1.201', '0.4529', '1.800', '0.1329', '1.805', '0.1197', '6.996', '0.7083', 1, 1, 1, 1, 1724682669.9845679]