TEST_NAME : Wafer
TEST_DATE : 24_08_26-16_31_38
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-004-021-09 | FUSED_ID : 6359364768386531673
  IC_TEMP :  -67.17 | VDDM : 1111.25 | AUX_INT :  -11.58 | CsaBias :   64.25
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.37829e-03 / 2
  ADC_P0  : -1.15814e-02 ± 3.31846e-02
  ADC_P1  : 8.47435e-03 ± 8.23123e-04
  ADC_P2  : -5.36809e-06 ± 4.09561e-06
  CSA_Chi2/NDF : 1.82081e-04 / 2
  CSA_P0  : 5.88737e-02 ± 9.00025e-03
  CSA_P1  : 1.03837e-02 ± 6.78104e-04
  CSA_P2  : -6.31115e-05 ± 1.03267e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [3, 17, 69, 72, 90, 94, 95, 98, 99]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [20, 24, 38, 51, 52, 58, 105, 108]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4814', '1.800', '0.1369', '1.800', '0.1015', '7.000', '0.7072', 1, 1, 1, 1, 1724682698.5363593]
VI_after__Init : ['1.201', '0.4833', '1.800', '0.1377', '1.799', '0.0961', '7.000', '0.7074', 1, 1, 1, 1, 1724682706.775715]
VI_at__the_End : ['1.201', '0.4553', '1.800', '0.1338', '1.803', '0.1187', '7.000', '0.7080', 1, 1, 1, 1, 1724682765.8111734]