TEST_NAME : Wafer
TEST_DATE : 24_08_26-16_57_11
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-005-012-03 | FUSED_ID : 6359364768386535619
  IC_TEMP :  -64.05 | VDDM : 1125.73 | AUX_INT :   -8.92 | CsaBias :   59.35
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.28170e-03 / 2
  ADC_P0  : -8.92172e-03 ± 2.42635e-02
  ADC_P1  : 8.58114e-03 ± 6.10064e-04
  ADC_P2  : -5.86680e-06 ± 3.05669e-06
  CSA_Chi2/NDF : 2.01105e-04 / 2
  CSA_P0  : 5.79603e-02 ± 9.45876e-03
  CSA_P1  : 1.00097e-02 ± 7.12649e-04
  CSA_P2  : -5.63817e-05 ± 1.08528e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  18
 | N_BROKEN_FAST :  [1, 16, 31, 36, 37, 41, 66, 67, 68, 78, 87, 95, 102, 116, 122, 126, 127]
 | N_BROKEN_SLOW :  [40]
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [16, 26, 38, 41, 53, 84, 103, 104, 106, 109, 118, 119]
 | P_BROKEN_SLOW :  [40]
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3916', '1.800', '0.1651', '1.799', '0.1066', '7.000', '0.7072', 1, 1, 1, 1, 1724684230.9896636]
VI_after__Init : ['1.202', '0.3918', '1.800', '0.1660', '1.800', '0.1007', '7.000', '0.7073', 1, 1, 1, 1, 1724684239.1840885]
VI_at__the_End : ['1.201', '0.4597', '1.800', '0.1361', '1.799', '0.1188', '7.000', '0.7079', 1, 1, 1, 1, 1724684300.2523506]