TEST_NAME : Wafer
TEST_DATE : 24_08_26-16_52_23
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-005-015-03 | FUSED_ID : 6359364768386535667
  IC_TEMP :  -65.59 | VDDM : 1127.73 | AUX_INT :   -7.68 | CsaBias :   60.00
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.25434e-03 / 2
  ADC_P0  : -7.67653e-03 ± 2.40249e-02
  ADC_P1  : 8.50500e-03 ± 6.06727e-04
  ADC_P2  : -5.63071e-06 ± 3.03408e-06
  CSA_Chi2/NDF : 1.63713e-04 / 2
  CSA_P0  : 5.75262e-02 ± 8.53423e-03
  CSA_P1  : 1.00105e-02 ± 6.42993e-04
  CSA_P2  : -5.69567e-05 ± 9.79202e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  17
 | N_BROKEN_FAST :  [3, 9, 11, 14, 22, 32, 44, 45, 47, 58, 62, 77, 78, 82, 83, 93, 108]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  17
 | P_BROKEN_FAST :  [17, 20, 46, 47, 60, 66, 70, 72, 78, 81, 87, 95, 104, 114, 116, 118, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4193', '1.800', '0.1650', '1.800', '0.0995', '7.000', '0.7078', 1, 1, 1, 1, 1724683942.5268207]
VI_after__Init : ['1.201', '0.4206', '1.800', '0.1655', '1.803', '0.0920', '7.000', '0.7072', 1, 1, 1, 1, 1724683951.4661279]
VI_at__the_End : ['1.201', '0.4559', '1.800', '0.1332', '1.799', '0.1200', '7.000', '0.7077', 1, 1, 1, 1, 1724684010.7435946]