TEST_NAME : Wafer
TEST_DATE : 24_08_26-16_47_36
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-005-018-04 | FUSED_ID : 6359364768386535716
  IC_TEMP :  -67.64 | VDDM : 1127.77 | AUX_INT :  -58.20 | CsaBias :   15.94
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.53212e-03 / 2
  ADC_P0  : -5.81995e-02 ± 3.76481e-02
  ADC_P1  : 9.33113e-03 ± 9.40698e-04
  ADC_P2  : -7.94486e-06 ± 4.67230e-06
  CSA_Chi2/NDF : 1.80010e-04 / 2
  CSA_P0  : 5.86323e-02 ± 8.94892e-03
  CSA_P1  : 1.03778e-02 ± 6.74236e-04
  CSA_P2  : -6.38989e-05 ± 1.02678e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [3, 7, 12, 16, 28, 31, 76, 83, 85, 95, 102, 103, 104, 108, 110, 113]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [15, 16, 20, 23, 24, 34, 35, 70, 79, 91, 95, 100, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3099', '1.800', '0.1500', '1.800', '0.0918', '7.000', '0.7072', 1, 1, 1, 1, 1724683656.0398157]
VI_after__Init : ['1.202', '0.3098', '1.800', '0.1500', '1.801', '0.0860', '7.000', '0.7073', 1, 1, 1, 1, 1724683664.279138]
VI_at__the_End : ['1.201', '0.4540', '1.800', '0.1354', '1.803', '0.1182', '7.000', '0.7080', 1, 1, 1, 1, 1724683730.8220997]