TEST_NAME : Wafer
TEST_DATE : 24_08_26-16_46_00
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-005-019-04 | FUSED_ID : 6359364768386535732
  IC_TEMP :  -79.02 | VDDM : 1117.45 | AUX_INT :   -9.96 | CsaBias :   34.96
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.54109e-03 / 2
  ADC_P0  : -9.95830e-03 ± 2.65743e-02
  ADC_P1  : 9.02076e-03 ± 6.87267e-04
  ADC_P2  : -7.26899e-06 ± 3.53583e-06
  CSA_Chi2/NDF : 1.77798e-04 / 2
  CSA_P0  : 5.91256e-02 ± 8.89376e-03
  CSA_P1  : 1.03048e-02 ± 6.70080e-04
  CSA_P2  : -6.64104e-05 ± 1.02045e-05
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [8, 9, 19, 22, 31, 32, 38, 40, 68, 91, 100, 107, 112, 116]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [22, 30, 56, 62, 72, 73, 90, 95, 96, 107]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.2554', '1.800', '0.1484', '1.799', '0.0971', '7.000', '0.7072', 1, 1, 1, 1, 1724683560.2001264]
VI_after__Init : ['1.201', '0.2556', '1.800', '0.1485', '1.800', '0.0915', '7.000', '0.7072', 1, 1, 1, 1, 1724683568.2705352]
VI_at__the_End : ['1.201', '0.4402', '1.800', '0.1341', '1.801', '0.1217', '7.000', '0.7079', 1, 1, 1, 1, 1724683635.2423635]