TEST_NAME : Wafer
TEST_DATE : 24_08_26-16_42_49
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-005-021-04 | FUSED_ID : 6359364768386535764
  IC_TEMP :  -67.11 | VDDM : 1123.04 | AUX_INT :  -10.50 | CsaBias :   60.06
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.74206e-03 / 2
  ADC_P0  : -1.04986e-02 ± 2.82976e-02
  ADC_P1  : 8.87313e-03 ± 7.25312e-04
  ADC_P2  : -6.61739e-06 ± 3.71092e-06
  CSA_Chi2/NDF : 1.61577e-04 / 2
  CSA_P0  : 6.09065e-02 ± 8.47837e-03
  CSA_P1  : 1.01447e-02 ± 6.38784e-04
  CSA_P2  : -5.63672e-05 ± 9.72793e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [5, 35, 40, 42, 50, 67, 69, 76, 79, 84, 110, 114, 118, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  15
 | P_BROKEN_FAST :  [1, 3, 4, 5, 18, 24, 31, 41, 45, 67, 68, 72, 79, 81, 91]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1948', '1.800', '0.1849', '1.799', '0.0886', '7.000', '0.7071', 1, 1, 1, 1, 1724683368.7498858]
VI_after__Init : ['1.201', '0.1948', '1.800', '0.1850', '1.800', '0.0829', '7.000', '0.7072', 1, 1, 1, 1, 1724683376.870298]
VI_at__the_End : ['1.201', '0.4691', '1.800', '0.1376', '1.799', '0.1187', '7.000', '0.7079', 1, 1, 1, 1, 1724683443.5181873]