TEST_NAME : Wafer
TEST_DATE : 24_08_26-16_39_37
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-005-023-04 | FUSED_ID : 6359364768386535796
  IC_TEMP :  -68.45 | VDDM : 1110.56 | AUX_INT :  -10.95 | CsaBias :   58.15
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.79296e-03 / 2
  ADC_P0  : -1.09453e-02 ± 2.87161e-02
  ADC_P1  : 8.68445e-03 ± 7.25295e-04
  ADC_P2  : -5.88624e-06 ± 3.67591e-06
  CSA_Chi2/NDF : 2.06654e-04 / 2
  CSA_P0  : 5.68189e-02 ± 9.58836e-03
  CSA_P1  : 1.04021e-02 ± 7.22414e-04
  CSA_P2  : -6.28394e-05 ± 1.10015e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [8, 10, 15, 20, 33, 40, 43, 51, 65, 81, 120, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [5, 6, 23, 27, 37, 39, 43, 45, 56, 58, 109, 118, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1531', '1.800', '0.1168', '1.799', '0.0863', '7.000', '0.7075', 1, 1, 1, 1, 1724683176.9185576]
VI_after__Init : ['1.201', '0.1532', '1.800', '0.1168', '1.802', '0.0805', '6.997', '0.7074', 1, 1, 1, 1, 1724683185.0730038]
VI_at__the_End : ['1.202', '0.4578', '1.800', '0.1349', '1.799', '0.1179', '7.001', '0.7083', 1, 1, 1, 1, 1724683252.785866]