TEST_NAME : Wafer
TEST_DATE : 24_08_26-16_38_01
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-005-024-04 | FUSED_ID : 6359364768386535812
  IC_TEMP :  -67.22 | VDDM : 1123.76 | AUX_INT :   -9.51 | CsaBias :   58.86
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.51457e-03 / 2
  ADC_P0  : -9.50793e-03 ± 2.64245e-02
  ADC_P1  : 8.58860e-03 ± 6.72768e-04
  ADC_P2  : -5.33056e-06 ± 3.42353e-06
  CSA_Chi2/NDF : 2.11617e-04 / 2
  CSA_P0  : 5.82829e-02 ± 9.70282e-03
  CSA_P1  : 1.04579e-02 ± 7.31037e-04
  CSA_P2  : -6.09976e-05 ± 1.11328e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [14, 19, 21, 32, 55, 73, 81, 99, 104, 110, 111, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [8, 28, 40, 48, 49, 58, 59, 72, 74, 103, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3177', '1.800', '0.1192', '1.800', '0.0977', '7.000', '0.7073', 1, 1, 1, 1, 1724683080.5101042]
VI_after__Init : ['1.201', '0.3187', '1.800', '0.1192', '1.800', '0.0917', '7.000', '0.7074', 1, 1, 1, 1, 1724683089.2793252]
VI_at__the_End : ['1.202', '0.4703', '1.800', '0.1340', '1.805', '0.1198', '7.000', '0.7077', 1, 1, 1, 1, 1724683157.4891198]