TEST_NAME : Wafer
TEST_DATE : 24_08_26-16_36_25
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-005-025-04 | FUSED_ID : 6359364768386535828
  IC_TEMP :  -68.85 | VDDM : 1116.64 | AUX_INT :  -11.10 | CsaBias :   65.89
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.08644e-03 / 2
  ADC_P0  : -1.10979e-02 ± 3.10489e-02
  ADC_P1  : 8.60556e-03 ± 7.79376e-04
  ADC_P2  : -5.71079e-06 ± 3.92132e-06
  CSA_Chi2/NDF : 2.10999e-04 / 2
  CSA_P0  : 5.60454e-02 ± 9.68863e-03
  CSA_P1  : 1.02924e-02 ± 7.29968e-04
  CSA_P2  : -5.87608e-05 ± 1.11166e-05
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [6, 14, 25, 31, 37, 97, 101, 103, 107, 108, 109]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [7, 10, 36, 53, 59, 64, 83, 85, 90, 96, 117, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.1654', '1.800', '0.1234', '1.800', '0.0857', '7.000', '0.7072', 1, 1, 1, 1, 1724682984.6223533]
VI_after__Init : ['1.202', '0.1655', '1.800', '0.1234', '1.800', '0.0803', '7.000', '0.7070', 1, 1, 1, 1, 1724682992.7808096]
VI_at__the_End : ['1.201', '0.4669', '1.800', '0.1332', '1.802', '0.1177', '7.000', '0.7081', 1, 1, 1, 1, 1724683059.200661]