TEST_NAME : Wafer
TEST_DATE : 24_08_26-17_12_57
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-006-004-13 | FUSED_ID : 6359364768386539597
  IC_TEMP :  -62.01 | VDDM : 1118.97 | AUX_INT :  -10.85 | CsaBias :   57.52
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.88415e-03 / 2
  ADC_P0  : -1.08458e-02 ± 2.94521e-02
  ADC_P1  : 8.59569e-03 ± 7.30235e-04
  ADC_P2  : -6.18956e-06 ± 3.61808e-06
  CSA_Chi2/NDF : 1.96559e-04 / 2
  CSA_P0  : 5.84306e-02 ± 9.35124e-03
  CSA_P1  : 1.04148e-02 ± 7.04548e-04
  CSA_P2  : -5.95657e-05 ± 1.07294e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [13, 25, 42, 48, 49, 51, 52, 54, 56, 69, 86, 92, 107, 113, 120, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [1, 3, 11, 16, 24, 38, 47, 59, 85, 117, 118, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1660', '1.800', '0.0765', '1.801', '0.0901', '7.000', '0.7079', 1, 1, 1, 1, 1724685177.494085]
VI_after__Init : ['1.202', '0.1655', '1.800', '0.0765', '1.804', '0.0830', '7.000', '0.7069', 1, 1, 1, 1, 1724685185.6743536]
VI_at__the_End : ['1.201', '0.4732', '1.800', '0.1371', '1.804', '0.1167', '7.000', '0.7078', 1, 1, 1, 1, 1724685252.1492784]