TEST_NAME : Wafer
TEST_DATE : 24_08_26-17_17_44
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-006-007-13 | FUSED_ID : 6359364768386539645
  IC_TEMP :  -62.33 | VDDM : 1123.50 | AUX_INT :   -8.69 | CsaBias :   60.95
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.34735e-03 / 2
  ADC_P0  : -8.68645e-03 ± 2.48703e-02
  ADC_P1  : 8.75712e-03 ± 6.34522e-04
  ADC_P2  : -6.54422e-06 ± 3.20897e-06
  CSA_Chi2/NDF : 1.32233e-04 / 2
  CSA_P0  : 5.74038e-02 ± 7.66995e-03
  CSA_P1  : 9.44693e-03 ± 5.77875e-04
  CSA_P2  : -4.54098e-05 ± 8.80036e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  17
 | N_BROKEN_FAST :  [10, 44, 49, 50, 53, 57, 66, 67, 76, 80, 84, 85, 88, 103, 104, 109, 113]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [10, 21, 29, 44, 45, 47, 51, 57, 75, 98, 103, 111, 117, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3326', '1.800', '0.1607', '1.800', '0.0954', '7.000', '0.7075', 1, 1, 1, 1, 1724685464.4879873]
VI_after__Init : ['1.201', '0.3326', '1.800', '0.1608', '1.800', '0.0894', '7.000', '0.7072', 1, 1, 1, 1, 1724685472.5674577]
VI_at__the_End : ['1.201', '0.4677', '1.800', '0.1379', '1.807', '0.1145', '7.000', '0.7082', 1, 1, 1, 1, 1724685537.7533646]