TEST_NAME : Wafer
TEST_DATE : 24_08_26-17_28_55
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-006-014-13 | FUSED_ID : 6359364768386539757
  IC_TEMP :  -65.34 | VDDM : 1131.11 | AUX_INT :   -9.02 | CsaBias :   45.39
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.26894e-03 / 2
  ADC_P0  : -9.01508e-03 ± 2.41029e-02
  ADC_P1  : 9.11105e-03 ± 6.34844e-04
  ADC_P2  : -7.26976e-06 ± 3.32080e-06
  CSA_Chi2/NDF : 1.60941e-04 / 2
  CSA_P0  : 6.12302e-02 ± 8.46166e-03
  CSA_P1  : 1.07459e-02 ± 6.37525e-04
  CSA_P2  : -6.40872e-05 ± 9.70875e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [9, 13, 16, 23, 30, 32, 36, 37, 43, 68, 71, 78, 84, 85, 91, 112]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [6, 12, 30, 45, 57, 60, 66, 67, 69, 74, 93, 96, 103, 116]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.4572', '1.800', '0.1568', '1.799', '0.1035', '7.000', '0.7089', 1, 1, 1, 1, 1724686134.7416887]
VI_after__Init : ['1.201', '0.4583', '1.800', '0.1578', '1.800', '0.0954', '7.000', '0.7081', 1, 1, 1, 1, 1724686142.9250274]
VI_at__the_End : ['1.201', '0.4791', '1.800', '0.1419', '1.803', '0.1153', '7.000', '0.7085', 1, 1, 1, 1, 1724686209.1679745]