TEST_NAME : Wafer
TEST_DATE : 24_08_26-17_32_07
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-006-016-10 | FUSED_ID : 6359364768386539786
  IC_TEMP :  -62.44 | VDDM : 1125.27 | AUX_INT :   -7.94 | CsaBias :   66.69
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.18959e-03 / 2
  ADC_P0  : -7.93568e-03 ± 2.33950e-02
  ADC_P1  : 8.33857e-03 ± 5.80486e-04
  ADC_P2  : -5.22574e-06 ± 2.86012e-06
  CSA_Chi2/NDF : 1.60799e-04 / 2
  CSA_P0  : 5.69680e-02 ± 8.45793e-03
  CSA_P1  : 9.95093e-03 ± 6.37244e-04
  CSA_P2  : -5.41425e-05 ± 9.70447e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  20
 | N_BROKEN_FAST :  [10, 15, 23, 30, 34, 38, 39, 48, 49, 50, 63, 72, 78, 90, 99, 108, 114, 122, 125, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [3, 14, 24, 33, 41, 50, 57, 62, 75, 91, 97, 101, 104, 116]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1925', '1.800', '0.1759', '1.800', '0.0895', '7.000', '0.7078', 1, 1, 1, 1, 1724686326.7669184]
VI_after__Init : ['1.201', '0.1926', '1.800', '0.1760', '1.800', '0.0841', '7.000', '0.7079', 1, 1, 1, 1, 1724686334.9502215]
VI_at__the_End : ['1.201', '0.4646', '1.800', '0.1363', '1.802', '0.1178', '7.000', '0.7088', 1, 1, 1, 1, 1724686397.2595603]