TEST_NAME : Wafer
TEST_DATE : 24_08_26-17_33_43
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-006-017-10 | FUSED_ID : 6359364768386539802
  IC_TEMP :  -62.93 | VDDM : 1120.15 | AUX_INT :  -11.63 | CsaBias :   58.22
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.08261e-03 / 2
  ADC_P0  : -1.16331e-02 ± 3.09624e-02
  ADC_P1  : 8.78228e-03 ± 7.82195e-04
  ADC_P2  : -6.40752e-06 ± 3.96032e-06
  CSA_Chi2/NDF : 1.50792e-04 / 2
  CSA_P0  : 6.04668e-02 ± 8.19052e-03
  CSA_P1  : 1.00551e-02 ± 6.17097e-04
  CSA_P2  : -5.58322e-05 ± 9.39765e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [17, 19, 24, 35, 49, 56, 58, 59, 60, 62, 65, 76, 86, 98, 105, 106]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  17
 | P_BROKEN_FAST :  [6, 11, 18, 27, 40, 53, 65, 67, 83, 92, 95, 101, 104, 115, 117, 120, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3274', '1.799', '0.1450', '1.800', '0.0952', '7.000', '0.7079', 1, 1, 1, 1, 1724686423.0354557]
VI_after__Init : ['1.201', '0.3274', '1.800', '0.1451', '1.801', '0.0895', '7.000', '0.7079', 1, 1, 1, 1, 1724686431.2369182]
VI_at__the_End : ['1.201', '0.4681', '1.800', '0.1374', '1.800', '0.1174', '7.000', '0.7086', 1, 1, 1, 1, 1724686495.9328513]