TEST_NAME : Wafer
TEST_DATE : 24_08_26-17_36_54
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-006-019-10 | FUSED_ID : 6359364768386539834
  IC_TEMP :  -57.85 | VDDM : 1128.36 | AUX_INT :  -88.37 | CsaBias :   -2.45
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.18707e-03 / 2
  ADC_P0  : -8.83664e-02 ± 3.68381e-02
  ADC_P1  : 9.63489e-03 ± 8.80331e-04
  ADC_P2  : -9.85891e-06 ± 4.17074e-06
  CSA_Chi2/NDF : 1.59093e-04 / 2
  CSA_P0  : 5.72307e-02 ± 8.41294e-03
  CSA_P1  : 9.75971e-03 ± 6.33854e-04
  CSA_P2  : -4.96952e-05 ± 9.65285e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [33, 49, 72, 80, 98, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  17
 | P_BROKEN_FAST :  [5, 11, 23, 33, 42, 44, 54, 63, 69, 78, 80, 82, 85, 86, 93, 114, 115]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3466', '1.800', '0.1361', '1.799', '0.0929', '7.000', '0.7077', 1, 1, 1, 1, 1724686613.9368837]
VI_after__Init : ['1.201', '0.3456', '1.800', '0.1362', '1.799', '0.0870', '7.000', '0.7077', 1, 1, 1, 1, 1724686622.0422926]
VI_at__the_End : ['1.202', '0.4719', '1.800', '0.1356', '1.803', '0.1153', '7.000', '0.7082', 1, 1, 1, 1, 1724686686.9672253]