TEST_NAME : Wafer
TEST_DATE : 24_08_26-17_38_29
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-006-020-10 | FUSED_ID : 6359364768386539850
  IC_TEMP :  -62.76 | VDDM : 1122.60 | AUX_INT :   -9.30 | CsaBias :   60.76
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.45002e-03 / 2
  ADC_P0  : -9.29931e-03 ± 2.57801e-02
  ADC_P1  : 8.81355e-03 ± 6.54071e-04
  ADC_P2  : -6.94741e-06 ± 3.29181e-06
  CSA_Chi2/NDF : 1.69752e-04 / 2
  CSA_P0  : 6.02331e-02 ± 8.69021e-03
  CSA_P1  : 1.03759e-02 ± 6.54744e-04
  CSA_P2  : -5.91329e-05 ± 9.97098e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [17, 33, 36, 37, 44, 47, 51, 59, 78, 82, 83, 90]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  19
 | P_BROKEN_FAST :  [2, 6, 12, 16, 18, 19, 37, 45, 48, 49, 62, 63, 67, 90, 92, 104, 111, 112, 115]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1450', '1.800', '0.1368', '1.800', '0.0862', '7.000', '0.7077', 1, 1, 1, 1, 1724686709.1276793]
VI_after__Init : ['1.202', '0.1451', '1.800', '0.1368', '1.801', '0.0808', '7.000', '0.7075', 1, 1, 1, 1, 1724686717.2660232]
VI_at__the_End : ['1.201', '0.4754', '1.800', '0.1368', '1.800', '0.1183', '7.000', '0.7083', 1, 1, 1, 1, 1724686783.9968784]