TEST_NAME : Wafer
TEST_DATE : 24_08_26-17_40_05
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-006-021-10 | FUSED_ID : 6359364768386539866
  IC_TEMP :  -61.94 | VDDM : 1117.53 | AUX_INT :  -10.92 | CsaBias :   58.67
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.96518e-03 / 2
  ADC_P0  : -1.09214e-02 ± 3.00902e-02
  ADC_P1  : 8.74962e-03 ± 7.61932e-04
  ADC_P2  : -6.34128e-06 ± 3.85439e-06
  CSA_Chi2/NDF : 1.61642e-04 / 2
  CSA_P0  : 5.90690e-02 ± 8.48007e-03
  CSA_P1  : 1.07165e-02 ± 6.38912e-04
  CSA_P2  : -6.22102e-05 ± 9.72988e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [12, 15, 44, 59, 66, 74, 78, 94, 103, 113, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [32, 34, 46, 47, 51, 57, 63, 79, 87, 105]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.1865', '1.800', '0.1464', '1.799', '0.0847', '7.000', '0.7079', 1, 1, 1, 1, 1724686805.0153363]
VI_after__Init : ['1.201', '0.1865', '1.800', '0.1464', '1.799', '0.0773', '7.000', '0.7072', 1, 1, 1, 1, 1724686813.258575]
VI_at__the_End : ['1.201', '0.4822', '1.800', '0.1361', '1.804', '0.1167', '7.000', '0.7079', 1, 1, 1, 1, 1724686875.2098603]