TEST_NAME : Wafer
TEST_DATE : 24_08_26-17_43_16
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-006-023-10 | FUSED_ID : 6359364768386539898
  IC_TEMP :  -55.75 | VDDM : 1109.90 | AUX_INT :  -10.61 | CsaBias :   67.26
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.73714e-03 / 2
  ADC_P0  : -1.06099e-02 ± 2.82473e-02
  ADC_P1  : 8.71072e-03 ± 7.08748e-04
  ADC_P2  : -6.45416e-06 ± 3.55076e-06
  CSA_Chi2/NDF : 1.65439e-04 / 2
  CSA_P0  : 5.60051e-02 ± 8.57909e-03
  CSA_P1  : 1.00958e-02 ± 6.46373e-04
  CSA_P2  : -5.38406e-05 ± 9.84349e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [9, 15, 22, 27, 39, 79, 82, 94, 97, 101, 112, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [12, 19, 20, 32, 48, 66, 95, 106, 110, 117, 120, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1989', '1.800', '0.1497', '1.800', '0.0926', '7.000', '0.7072', 1, 1, 1, 1, 1724686996.6035154]
VI_after__Init : ['1.202', '0.1990', '1.800', '0.1516', '1.799', '0.0867', '7.000', '0.7072', 1, 1, 1, 1, 1724687004.700016]
VI_at__the_End : ['1.202', '0.4739', '1.800', '0.1390', '1.799', '0.1149', '7.000', '0.7079', 1, 1, 1, 1, 1724687072.963792]