TEST_NAME : Wafer
TEST_DATE : 24_08_26-18_26_05
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-007-003-00 | FUSED_ID : 6359364768386543664
  IC_TEMP :  -67.60 | VDDM : 1115.78 | AUX_INT :   -9.46 | CsaBias :   60.22
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.53448e-03 / 2
  ADC_P0  : -9.45989e-03 ± 2.66082e-02
  ADC_P1  : 8.75338e-03 ± 6.92250e-04
  ADC_P2  : -5.48189e-06 ± 3.59860e-06
  CSA_Chi2/NDF : 1.91017e-04 / 2
  CSA_P0  : 5.76691e-02 ± 9.21846e-03
  CSA_P1  : 1.03566e-02 ± 6.94544e-04
  CSA_P2  : -6.00884e-05 ± 1.05771e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [6, 13, 20, 28, 29, 36, 45, 51, 61, 66, 88, 93, 99, 118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  16
 | P_BROKEN_FAST :  [3, 12, 32, 44, 47, 54, 66, 69, 73, 76, 87, 88, 91, 95, 121, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2587', '1.800', '0.1175', '1.800', '0.0877', '7.000', '0.7070', 1, 1, 1, 1, 1724689564.794238]
VI_after__Init : ['1.201', '0.2589', '1.800', '0.1175', '1.801', '0.0821', '7.000', '0.7073', 1, 1, 1, 1, 1724689572.9186203]
VI_at__the_End : ['1.201', '0.4660', '1.800', '0.1378', '1.804', '0.1160', '7.000', '0.7079', 1, 1, 1, 1, 1724689640.2301428]