TEST_NAME : Wafer
TEST_DATE : 24_08_26-18_22_54
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-007-005-00 | FUSED_ID : 6359364768386543696
  IC_TEMP :  -62.11 | VDDM : 1129.77 | AUX_INT :   -8.53 | CsaBias :   54.42
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.17149e-03 / 2
  ADC_P0  : -8.53430e-03 ± 2.31857e-02
  ADC_P1  : 9.03879e-03 ± 6.16437e-04
  ADC_P2  : -6.48613e-06 ± 3.26058e-06
  CSA_Chi2/NDF : 1.87020e-04 / 2
  CSA_P0  : 5.91553e-02 ± 9.12149e-03
  CSA_P1  : 1.08895e-02 ± 6.87239e-04
  CSA_P2  : -6.57756e-05 ± 1.04658e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [6, 10, 12, 14, 19, 24, 33, 41, 45, 46, 49, 51, 61, 90, 93, 101]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [3, 6, 13, 14, 16, 43, 56, 61, 80, 91, 115, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1985', '1.800', '0.1375', '1.799', '0.0869', '7.000', '0.7072', 1, 1, 1, 1, 1724689373.9487636]
VI_after__Init : ['1.201', '0.1985', '1.800', '0.1375', '1.799', '0.0810', '7.000', '0.7072', 1, 1, 1, 1, 1724689382.025075]
VI_at__the_End : ['1.201', '0.4794', '1.800', '0.1403', '1.799', '0.1163', '7.000', '0.7078', 1, 1, 1, 1, 1724689448.5266354]