TEST_NAME : Wafer
TEST_DATE : 24_08_26-18_21_18
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-007-006-00 | FUSED_ID : 6359364768386543712
  IC_TEMP :  -58.31 | VDDM : 1106.64 | AUX_INT :   -8.39 | CsaBias :   75.05
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.28354e-03 / 2
  ADC_P0  : -8.38733e-03 ± 2.42754e-02
  ADC_P1  : 8.40240e-03 ± 5.97111e-04
  ADC_P2  : -5.86791e-06 ± 2.91181e-06
  CSA_Chi2/NDF : 1.70964e-04 / 2
  CSA_P0  : 5.47339e-02 ± 8.72116e-03
  CSA_P1  : 1.00786e-02 ± 6.57076e-04
  CSA_P2  : -5.22255e-05 ± 1.00065e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [0, 1, 5, 6, 20, 22, 44, 49, 62, 72, 86, 93, 97, 99, 106, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [16, 35, 50, 53, 69, 75, 81, 90, 113, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3744', '1.800', '0.1718', '1.799', '0.0957', '7.000', '0.7071', 1, 1, 1, 1, 1724689277.9166505]
VI_after__Init : ['1.201', '0.3739', '1.800', '0.1715', '1.799', '0.0903', '7.000', '0.7074', 1, 1, 1, 1, 1724689285.908945]
VI_at__the_End : ['1.201', '0.4756', '1.800', '0.1363', '1.804', '0.1117', '7.000', '0.7079', 1, 1, 1, 1, 1724689351.0867362]