TEST_NAME : Wafer
TEST_DATE : 24_08_26-18_18_07
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-007-008-00 | FUSED_ID : 6359364768386543744
  IC_TEMP :  -57.79 | VDDM : 1125.02 | AUX_INT :   -5.80 | CsaBias :   62.93
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.57804e-04 / 2
  ADC_P0  : -5.80452e-03 ± 1.86646e-02
  ADC_P1  : 8.63269e-03 ± 4.90393e-04
  ADC_P2  : -5.06874e-06 ± 2.54815e-06
  CSA_Chi2/NDF : 1.54253e-04 / 2
  CSA_P0  : 5.88551e-02 ± 8.28398e-03
  CSA_P1  : 9.98549e-03 ± 6.24138e-04
  CSA_P2  : -5.22665e-05 ± 9.50489e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  18
 | N_BROKEN_FAST :  [2, 9, 27, 28, 34, 50, 60, 66, 67, 69, 70, 78, 84, 85, 98, 103, 110, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  15
 | P_BROKEN_FAST :  [2, 5, 26, 29, 43, 52, 56, 61, 64, 65, 67, 91, 110, 112, 117]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1996', '1.800', '0.1494', '1.800', '0.0832', '7.001', '0.7076', 1, 1, 1, 1, 1724689087.1086733]
VI_after__Init : ['1.201', '0.1998', '1.800', '0.1494', '1.801', '0.0775', '7.000', '0.7075', 1, 1, 1, 1, 1724689095.096021]
VI_at__the_End : ['1.201', '0.4762', '1.800', '0.1377', '1.805', '0.1129', '7.000', '0.7080', 1, 1, 1, 1, 1724689154.2329922]