TEST_NAME : Wafer
TEST_DATE : 24_08_26-18_16_31
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-007-009-00 | FUSED_ID : 6359364768386543760
  IC_TEMP :  -63.78 | VDDM : 1125.95 | AUX_INT :   -7.20 | CsaBias :   54.05
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.07696e-03 / 2
  ADC_P0  : -7.19846e-03 ± 2.22434e-02
  ADC_P1  : 8.79288e-03 ± 5.81105e-04
  ADC_P2  : -6.07520e-06 ± 3.00169e-06
  CSA_Chi2/NDF : 1.67692e-04 / 2
  CSA_P0  : 5.98746e-02 ± 8.63732e-03
  CSA_P1  : 1.03102e-02 ± 6.50760e-04
  CSA_P2  : -5.94454e-05 ± 9.91030e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  18
 | N_BROKEN_FAST :  [1, 4, 11, 19, 20, 22, 27, 29, 30, 40, 49, 50, 56, 57, 64, 74, 75, 77]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  17
 | P_BROKEN_FAST :  [4, 5, 30, 31, 39, 53, 62, 74, 85, 87, 91, 93, 105, 109, 117, 120, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1331', '1.800', '0.1585', '1.800', '0.0883', '7.000', '0.7072', 1, 1, 1, 1, 1724688991.3326073]
VI_after__Init : ['1.201', '0.1331', '1.800', '0.1579', '1.801', '0.0825', '7.000', '0.7081', 1, 1, 1, 1, 1724688999.4439392]
VI_at__the_End : ['1.201', '0.4699', '1.800', '0.1375', '1.803', '0.1151', '7.000', '0.7079', 1, 1, 1, 1, 1724689066.249418]