TEST_NAME : Wafer
TEST_DATE : 24_08_26-18_14_56
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-007-010-00 | FUSED_ID : 6359364768386543776
  IC_TEMP :  -71.18 | VDDM : 1121.53 | AUX_INT :   -9.02 | CsaBias :   52.08
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.25502e-03 / 2
  ADC_P0  : -9.02009e-03 ± 2.39463e-02
  ADC_P1  : 8.77826e-03 ± 6.02013e-04
  ADC_P2  : -7.08724e-06 ± 3.00084e-06
  CSA_Chi2/NDF : 1.90346e-04 / 2
  CSA_P0  : 5.82959e-02 ± 9.20225e-03
  CSA_P1  : 1.04858e-02 ± 6.93323e-04
  CSA_P2  : -6.38849e-05 ± 1.05585e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [0, 36, 46, 47, 52, 76, 83, 96, 100, 113, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  15
 | P_BROKEN_FAST :  [1, 8, 19, 24, 36, 44, 50, 61, 65, 74, 75, 92, 93, 97, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1603', '1.800', '0.1478', '1.800', '0.0823', '7.000', '0.7075', 1, 1, 1, 1, 1724688895.8188426]
VI_after__Init : ['1.201', '0.1605', '1.800', '0.1478', '1.799', '0.0765', '7.000', '0.7074', 1, 1, 1, 1, 1724688903.8542702]
VI_at__the_End : ['1.202', '0.4606', '1.800', '0.1357', '1.799', '0.1167', '7.000', '0.7082', 1, 1, 1, 1, 1724688971.9129984]