TEST_NAME : Wafer
TEST_DATE : 24_08_26-18_11_44
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-007-012-00 | FUSED_ID : 6359364768386543808
  IC_TEMP :  -61.74 | VDDM : 1124.22 | AUX_INT :   -8.85 | CsaBias :   60.41
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.18911e-03 / 2
  ADC_P0  : -8.84711e-03 ± 2.33426e-02
  ADC_P1  : 8.70618e-03 ± 5.94062e-04
  ADC_P2  : -6.15137e-06 ± 3.01015e-06
  CSA_Chi2/NDF : 1.68904e-04 / 2
  CSA_P0  : 6.03362e-02 ± 8.66847e-03
  CSA_P1  : 1.02918e-02 ± 6.53107e-04
  CSA_P2  : -5.89150e-05 ± 9.94604e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [14, 17, 25, 42, 48, 80, 84, 106, 115, 118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [15, 17, 20, 34, 51, 57, 93, 100, 107, 111]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3143', '1.800', '0.1469', '1.800', '0.0951', '7.000', '0.7076', 1, 1, 1, 1, 1724688703.9206119]
VI_after__Init : ['1.201', '0.3140', '1.800', '0.1469', '1.800', '0.0892', '7.000', '0.7076', 1, 1, 1, 1, 1724688711.8947945]
VI_at__the_End : ['1.202', '0.4676', '1.800', '0.1395', '1.807', '0.1150', '7.001', '0.7081', 1, 1, 1, 1, 1724688778.344872]