TEST_NAME : Wafer
TEST_DATE : 24_08_26-18_08_32
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-007-014-00 | FUSED_ID : 6359364768386543840
  IC_TEMP :  -58.75 | VDDM : 1123.31 | AUX_INT :  -10.36 | CsaBias :   67.24
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.82826e-03 / 2
  ADC_P0  : -1.03580e-02 ± 2.90543e-02
  ADC_P1  : 8.67228e-03 ± 7.42350e-04
  ADC_P2  : -5.55266e-06 ± 3.79605e-06
  CSA_Chi2/NDF : 1.66886e-04 / 2
  CSA_P0  : 5.97158e-02 ± 8.61653e-03
  CSA_P1  : 1.01323e-02 ± 6.49194e-04
  CSA_P2  : -5.63108e-05 ± 9.88645e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [1, 9, 10, 32, 33, 36, 44, 47, 64, 79, 85, 87, 90, 96, 97, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [22, 23, 26, 30, 48, 75, 103, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2156', '1.800', '0.1634', '1.800', '0.0841', '7.000', '0.7079', 1, 1, 1, 1, 1724688511.8912587]
VI_after__Init : ['1.202', '0.2157', '1.800', '0.1635', '1.800', '0.0785', '7.000', '0.7076', 1, 1, 1, 1, 1724688519.943546]
VI_at__the_End : ['1.202', '0.4713', '1.800', '0.1377', '1.799', '0.1155', '7.000', '0.7086', 1, 1, 1, 1, 1724688575.9332874]