TEST_NAME : Wafer
TEST_DATE : 24_08_26-18_05_21
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-007-016-07 | FUSED_ID : 6359364768386543879
  IC_TEMP :  -52.85 | VDDM : 1118.34 | AUX_INT :  -47.62 | CsaBias :   25.56
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.69843e-03 / 2
  ADC_P0  : -4.76194e-02 ± 3.00245e-02
  ADC_P1  : 9.21523e-03 ± 7.37351e-04
  ADC_P2  : -8.41938e-06 ± 3.59361e-06
  CSA_Chi2/NDF : 1.37368e-04 / 2
  CSA_P0  : 5.75688e-02 ± 7.81746e-03
  CSA_P1  : 9.88897e-03 ± 5.88989e-04
  CSA_P2  : -5.10512e-05 ± 8.96961e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [18, 28, 30, 35, 71, 75, 85, 90, 116, 120, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  15
 | P_BROKEN_FAST :  [21, 24, 31, 33, 38, 40, 63, 76, 77, 96, 104, 106, 112, 115, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4013', '1.800', '0.1514', '1.800', '0.1021', '7.000', '0.7076', 1, 1, 1, 1, 1724688321.1756892]
VI_after__Init : ['1.201', '0.4018', '1.800', '0.1515', '1.799', '0.0962', '7.000', '0.7075', 1, 1, 1, 1, 1724688329.2731442]
VI_at__the_End : ['1.201', '0.4746', '1.800', '0.1363', '1.803', '0.1132', '7.000', '0.7083', 1, 1, 1, 1, 1724688398.214834]