TEST_NAME : Wafer
TEST_DATE : 24_08_26-17_57_33
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-007-021-07 | FUSED_ID : 6359364768386543959
  IC_TEMP :  -55.73 | VDDM : 1133.41 | AUX_INT :   -7.66 | CsaBias :   76.22
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.44292e-04 / 2
  ADC_P0  : -7.65969e-03 ± 1.96107e-02
  ADC_P1  : 8.44977e-03 ± 4.81058e-04
  ADC_P2  : -6.20222e-06 ± 2.34075e-06
  CSA_Chi2/NDF : 1.13154e-04 / 2
  CSA_P0  : 5.92930e-02 ± 7.09507e-03
  CSA_P1  : 9.50425e-03 ± 5.34562e-04
  CSA_P2  : -4.38952e-05 ± 8.14075e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  15
 | N_BROKEN_FAST :  [20, 21, 25, 26, 48, 51, 61, 67, 74, 81, 85, 100, 106, 114, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [13, 14, 17, 55, 63, 69, 70, 88, 91, 94, 96, 104, 124, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2292', '1.800', '0.1523', '1.800', '0.0847', '7.000', '0.7078', 1, 1, 1, 1, 1724687853.2165308]
VI_after__Init : ['1.201', '0.2294', '1.800', '0.1523', '1.800', '0.0793', '7.000', '0.7076', 1, 1, 1, 1, 1724687861.304827]
VI_at__the_End : ['1.201', '0.4798', '1.800', '0.1342', '1.800', '0.1125', '7.000', '0.7085', 1, 1, 1, 1, 1724687922.2852042]