TEST_NAME : Wafer
TEST_DATE : 24_08_26-17_55_58
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-007-022-07 | FUSED_ID : 6359364768386543975
  IC_TEMP :  -62.71 | VDDM : 1121.70 | AUX_INT :  -10.99 | CsaBias :   67.07
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.94886e-03 / 2
  ADC_P0  : -1.09947e-02 ± 2.99744e-02
  ADC_P1  : 8.72752e-03 ± 7.61532e-04
  ADC_P2  : -5.98337e-06 ± 3.87490e-06
  CSA_Chi2/NDF : 1.75355e-04 / 2
  CSA_P0  : 5.99544e-02 ± 8.83246e-03
  CSA_P1  : 1.06914e-02 ± 6.65462e-04
  CSA_P2  : -6.60279e-05 ± 1.01342e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [0, 2, 8, 9, 13, 17, 27, 31, 63, 68, 69, 84, 92, 105, 116, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [29, 42, 43, 50, 60, 64, 69, 76, 90, 95, 102, 109, 111, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3307', '1.800', '0.1696', '1.800', '0.1001', '7.000', '0.7077', 1, 1, 1, 1, 1724687757.9757333]
VI_after__Init : ['1.202', '0.3310', '1.799', '0.1696', '1.800', '0.0943', '7.000', '0.7078', 1, 1, 1, 1, 1724687766.1921685]
VI_at__the_End : ['1.202', '0.4690', '1.799', '0.1387', '1.799', '0.1150', '7.000', '0.7083', 1, 1, 1, 1, 1724687834.506943]