TEST_NAME : Wafer
TEST_DATE : 24_08_26-17_52_46
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-007-024-07 | FUSED_ID : 6359364768386544007
  IC_TEMP :  -58.45 | VDDM : 1125.12 | AUX_INT :   -5.99 | CsaBias :   54.42
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 6.69950e-04 / 2
  ADC_P0  : -5.98621e-03 ± 1.75015e-02
  ADC_P1  : 8.67153e-03 ± 4.51395e-04
  ADC_P2  : -6.00565e-06 ± 2.29782e-06
  CSA_Chi2/NDF : 1.71786e-04 / 2
  CSA_P0  : 5.82000e-02 ± 8.74211e-03
  CSA_P1  : 1.00174e-02 ± 6.58655e-04
  CSA_P2  : -5.23192e-05 ± 1.00305e-05
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [7, 10, 17, 18, 34, 44, 51, 59, 64, 72, 75]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [6, 10, 33, 46, 47, 66, 69, 70, 77, 80, 91, 98, 110]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.3419', '1.800', '0.1623', '1.799', '0.1034', '7.000', '0.7074', 1, 1, 1, 1, 1724687566.4252782]
VI_after__Init : ['1.201', '0.3421', '1.800', '0.1626', '1.801', '0.0977', '7.000', '0.7075', 1, 1, 1, 1, 1724687574.4818134]
VI_at__the_End : ['1.201', '0.4769', '1.800', '0.1356', '1.804', '0.1160', '7.000', '0.7083', 1, 1, 1, 1, 1724687642.5535238]