TEST_NAME : Wafer
TEST_DATE : 24_08_26-18_30_53
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-008-004-04 | FUSED_ID : 6359364768386547780
  IC_TEMP :  -64.31 | VDDM : 1122.12 | AUX_INT :   -9.92 | CsaBias :   60.21
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.58643e-03 / 2
  ADC_P0  : -9.92152e-03 ± 2.70339e-02
  ADC_P1  : 8.81431e-03 ± 6.99274e-04
  ADC_P2  : -5.93087e-06 ± 3.61695e-06
  CSA_Chi2/NDF : 2.17530e-04 / 2
  CSA_P0  : 5.87772e-02 ± 9.83743e-03
  CSA_P1  : 1.04356e-02 ± 7.41180e-04
  CSA_P2  : -6.01942e-05 ± 1.12873e-05
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [3, 14, 19, 24, 28, 44, 46, 50, 69, 70, 76, 90, 93, 117, 121, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  16
 | P_BROKEN_FAST :  [7, 9, 14, 31, 44, 48, 71, 72, 73, 82, 88, 93, 104, 113, 114, 116]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.2626', '1.800', '0.1886', '1.800', '0.0906', '7.000', '0.7074', 1, 1, 1, 1, 1724689852.8931808]
VI_after__Init : ['1.201', '0.2628', '1.800', '0.1888', '1.800', '0.0848', '7.000', '0.7074', 1, 1, 1, 1, 1724689860.9325504]
VI_at__the_End : ['1.201', '0.4738', '1.800', '0.1412', '1.799', '0.1172', '7.000', '0.7079', 1, 1, 1, 1, 1724689927.788167]